Part Number Hot Search : 
HAT2202C PCF85 SMAJ11A 18XXX 20180M90 TLGU1100 1H222 4HCT0
Product Description
Full Text Search
 

To Download EVM646ATF Datasheet File

  If you can't view the Datasheet, Please click here to try to view without PDF Reader .  
 
 


  Datasheet File OCR Text:
  test and measurement products 1 www .semtech.com edge646 pin electronics driver, window comparator, and switch matrix description features functional block diagram applications revision 2 /october 21, 2002 the edge646 is an integrated trinary driver, window comparator, and switch matrix pin electronics solution manufactured in a wide voltage cmos process. it is designed for automatic test equipment and instrumentation where cost, functional density, and power are all at a premium. the tristatable driver is capable of generating 3 levels - one for a logic high, one for a logic low, and one for either a termination voltage or a special programming voltage. the on-board window comparator effectively determines whether the dut is in a high, low, or intermediate state. the switches are included to allow such functions as pmu, pull up, and pull down connections. the edge646 is intended to offer an extremely low leakage, low cost, low power, small footprint, per pin solution for 100 mhz and below pin electronics applications. compa high level low level compb load cva vinp cvb sw0 sw0 en* sw1 sw1 en* sw2 sw2 en* vbb vh vl dout vtt data data* dvr en dvr en* vtt en vtt en* 6nnee 6eie ee eeeeae ee eeeeaene eeaeseeeees e eeee
2 revision 2 / october 21, 2002 www .semtech.com test and measurement products edge646 pin description e m a n n i p# n i pn o i t p i r c s e d r e v i r d * a t a d / a t a d9 2 , 0 3r e v i r d e h t f o s u t a t s w o l / h g i h e h t s e n i m r e t e d t a h t t u p n i l a t i g i d . d e l b a n e s i t i n e h w * n e r v d / n e r v d1 3 , 2 3 e h t s e c a l p r o , r e v i r d e h t s e l b a s i d d n a s e l b a n e t a h t t u p n i l a t i g i d . e t a t s t t v e h t n i r e v i r d * n e t t v / n e t t v1 , 2 r e v i r d e h t s e c a l p * n e r v d r e h t e h w s e n i m r e t e d t a h t t u p n i l a t i g i d . l e v e l t t v e h t o t s e v i r d y l e v i t c a r o e t a t s e c n a d e p m i h g i h a n i t u o d3 2. t u p t u o r e v i r d t t v , l v , h v6 2 , 5 2 , 4 2 l a c i g o l a f o l e v e l e g a t l o v e h t t e s t a h t s t u p n i g o l a n a d e r e f f u b n u . t u p t u o r e v i r d e h t t a t t v r o , 0 , 1 b b v0 1- e l g n i s l l a r o f d l o h s e r h t e h t s e h s i l b a t s e h c i h w n i p t u p n i g o l a n a . s l a n g i s t u p n i l a t i g i d d e d n e r o t a r a p m o c p n i v9 1. t u p n i r o t a r a p m o c w o d n i w g o l a n a b v c , a v c8 1 , 0 2r o f s l e v e l d l o h s e r h t e h t t e s t a h t s t u p n i r o t a r a p m o c c d g o l a n a . r o t a r a p m o c w o d n i w e h t b p m o c , a p m o c8 , 5. s t u p t u o r o t a r a p m o c l a t i g i d l e v e l w o l l e v e l h g i h 7 6 f o s l e v e l h g i h d n a w o l l a t i g i d e h t h s i l b a t s e t a h t s t u p n i e g a t l o v . s t u p t u o r o t a r a p m o c e h t x i r t a m h c t i w s * n e 1 w s , * n e 0 w s * n e 2 w s 3 1 , 1 1 5 1 . 3 d n a , 2 , 1 , 0 s e h c t i w s e t a v i t c a t a h t s t u p n i e l b i t a p m o c l t t 0 w s 1 w s 2 w s 2 1 4 1 6 1 0 h c t i w s 1 h c t i w s 2 h c t i w s d a o l7 1. s e h c t i w s g o l a n a e h t o t t u d e h t s t c e n n o c t a h t n i p t u p n i s e i l p p u s r e w o p c c v7 2 , 2 2 , 3. y l p p u s r e w o p g o l a n a e v i t i s o p e e v8 2 , 1 2 , 4. y l p p u s r e w o p g o l a n a e v i t a g e n c / n9 . ) g n i t a o l f e v a e l ( n i p t c e n n o c o n
3 revision 2 / october 21, 2002 www .semtech.com test and measurement products edge646 pin description (continued) 1 25 17 9 dvr en dvr en* data data* vee vcc vtt vl vh dout vcc vee cva vinp cvb load vtt en* vtt en vcc vee compa high level low level compb n/c vbb sw0 en* sw0 sw1 en* sw1 sw2 en* sw2 32-pin, 7mm x 7mm tqfp
4 revision 2 / october 21, 2002 www .semtech.com test and measurement products edge646 output which series terminates the transmission line to the dut. in this environment, the driver can withstand a short to any legal dut voltage for an indefinite period. in a low impedance application with no additional output series resistance, care must be exercised and systems should be designed to check for this condition and tristate the driver if a short is detected. the driver does not have on-chip short circuit protection or limitation circuitry. vbb vbb is an analog input which establishes the threshold for all single ended digital input signals. if sw0 en*, sw1 en*, or sw2 en* are more positive than vbb, these inputs are a digital ?". conversely, if they are more negative than vbb, they are a ?". all digital inputs are wide voltage comparator inputs, so they are technology independent. by establishing the appropriate vbb level for the switch control inputs, and the appropriate differential input levels for the driver digital control inputs, the edge646 may be driven by ttl, ecl, cmos, or any custom level circuitry. figure 1. driver digital inputs figure 2. driver differential digital inputs circuit description driver description the edge646 driver supports three distinct programmable driver levels; high, low, termination, and high impedance. there are no restrictions between any of these three levels in that all three may vary independently over the entire operating voltage range between vcc and vee. the dvr en*, data, and vtt en pins are digital inputs that control the driver (see table 1). with dvr en* low, data determines whether the driver will force vh or vl at dout. with dvr en* high, vtt en* controls whether the driver goes into high impedance or drives vtt.. table 1. driver truth table vh, vl, and vtt vh, vl, and vtt define the logical ?? ?? and ?ermination?levels of the driver and can be adjusted anywhere over the range spanned by vcc to vee. there is no restriction between vh, vl, and vtt, in that they can all vary independently over the entire voltage range determined by the power supply levels. the vh, vl, and vtt inputs are unbuffered in that they also provide the driver output current, so the sources of these voltages must have ample current drive capability. while vtt is referred to as the termination voltage, it may also be used as a very high ?rogramming?level on many memory devices. driver output protection the edge646 is designed to operate in a functional testing environment where a controlled impedance (typically 50 ? ) is maintained between the pin electronics and the dut. in general, there will be an external resistor at the driver * n e r v dn e t t va t a dt u o d 10x z i h 11x t t v 0x0 l v 0x1 h v sw0 en* sw1 en* sw2 en* vbb data data* dvr en* dvr en vtt en vtt en*
5 revision 2 / october 21, 2002 www .semtech.com test and measurement products edge646 load the edge646 provides a total of 3 analog switches. individual switches vary in both their on resistance and their on/off time (see table 4). like the driver digital inputs, the switch matrix control inputs sw0-3 en* are technology independent as vbb determines their threshold level. the switch control is documented in table 3. table 3. switch matrix truth table table 4. switch matrix characteristics do not leave any digital input pins floating. circuit description (continued) receiver functionality the edge646 supports an on-board window comparator. cvb and cva are high impedance analog inputs which establish the threshold voltages. compa and compb are the digital outputs which reflect the real time status of vinp. table 2 summarizes the relationship between the threshold levels, vinp, and the output signals. table 2. comparator truth table comparator outputs the comparator outputs are 50 ? output impedance non- tristatable drivers designed to cleanly drive 50 ? transmission lines without requiring any external series termination resistors. input pins low level and high level establish the logic 0 and 1 levels respectively. in normal operation, low level would be connected to ground and high level would be connected to a system vdd supply, producing cmos digital swings at the output. however, the comparator outputs are technology independent in that they can drive pecl, 3v cmos, ecl, lv cmos, gtl, and custom levels by varying low level and high level. for example, should a 3v swing be desired, high level could be connected to a 3.0v power supply. notice that high level and low level provide both the voltage level and the current for the comparator outputs. high level and low level may be varied between +5v and -2v. p n i va p m o cb p m o c a v c < p n i v a v c > p n i v 1 0 x x b v c < p n i v b v c > p n i v x x 0 1 s t u p n i l o r t n o cs u t a t s 1 = * n e 0 w s 0 = * n e 0 w s d e t c e n n o c s i d 0 w s d e t c e n n o c 0 w s 1 = * n e 1 w s 0 = * n e 1 w s d e t c e n n o c s i d 1 w s d e t c e n n o c 1 w s 1 = * n e 2 w s 0 = * n e 2 w s d e t c e n n o c s i d 2 w s d e t c e n n o c 2 w s h c t i w st u o re m i t f f o / n o 0 w s0 5 ? s n 0 0 1 1 w s0 5 ? s n 0 0 1 2 w s0 5 ? s n 0 0 1
6 revision 2 / october 21, 2002 www .semtech.com test and measurement products edge646 application information preliminary power supplies decoupling a .1 f capacitor is recommended between vcc and vee. in addition, solid vcc and vee planes are recommended to provide a low inductance path for the power supply currents. these planes will reduce any inductive supply drops associated with swtiching currents on the power supply pins. if solid planes are not possible, then wide power busses are preferable. vh, vl, and vtt decoupling as the vh, vl, and vtt inputs are unbuffered and must supply the driver output current, decoupling capacitors for these inputs are recommended in proportion to the amount of output current the application requires. in general, a surge current of 50 ma (5v swings series terminated with 50 ohms into a 50 ohm transmission line) are the maxi- mum dynamic output currents the driver should see. the decoupling capacitors should be able to provide this cur- rent for the duration of the round trip time between the pin electronics and the dut, and then recharge themselves before the next such transition would occur. once this condition is satisfied, the vh, vl, and vtt supply voltages are more responsible for establishing the dc levels asso- ciated with each function and recharging the capacitors, rather than providing the actual dynamic currents required to drive the dut transmission line. ideally, vh, vl, and vtt would each have a dedicated power layer on the pc board for the lowest possible inductance power supply distribution. vcc vee 1n5820 or equivalent power supplies the edge646 uses two power supplies for circuit opera- tion; vcc and vee. in order to protect the edge646 and avoid damaging it, the following power supply requirements must be satisifed at all times: vee all inputs vcc the sequence below can be used as a guideline when operating the edge646: power-on sequencing power-off sequencing 1. vcc (substrate) 1. inputs 2. vee 2. vee 3. inputs 3. vcc the two diode configuration shown in figure 3 should be used on a once-per-board basis to ensure power supply sequence and fault tolerance. figure 3. power supply protection scheme warning: it is extremely important that the voltage on any device pin does not exceed the range of vee ?.5v to vcc +0.5v at any time, either during power up, normal operation, or during power down. failure to adhere to this requirement could result in latchup of the device, which could be destructive if the sys- tem power supplies are capable of supplying large amounts of current. even if the device is not imme- diately destroyed, the cumulative damage caused by the stress of repeated latchup may affect device re- liability.
7 revision 2 / october 21, 2002 www .semtech.com test and measurement products edge646 package information pin descriptions preliminary b d 3 4 4 e n / 4 tips 4 x e / 2 d / 2 see detail "a" e 0.20 c a C b d top view d1 e1 5 7 5 7 4 x d1 / 2 e1 / 2 0.20 h a C b d bottom view c o o
8 revision 2 / october 21, 2002 www .semtech.com test and measurement products edge646 package information (continued) 3 detail "a" e / 2 b 0 min. 0.08 / 0.20 r. gauge plane 0.25 0 C 7 l c.08 r. min. 0.20 min. 1.00 ref. datum plane C h C a1 0.05 a2 C s detail "b" 9    '''   $  
 &
(') *+,,  -./+0 #  # #  #1      
 % 
 )     #       
"" # --- $  $) $  $)   $ jedec variation all dimensions in millimeters ac min. nom. max. note a 1.60 a1 0.05 0.10 0.15 a2 1.35 1.40 1.45 d 9.00 bsc. 4 d1 7.00 bsc. 7,8 e 9.00 bsc. 4 e1 7.00 bsc. 7,8 l 0.45 0.60 0.75 m 0.15 n32 e 0.80 bsc. b 0.30 0.37 0.45 9 b1 0.30 0.35 0.40 ccc 0.10 ddd 0.20 notes: 1. all dimensions and tolerances conform to ansi y14.5-1982. 2. datum plane -h- located at mold parting line and coincident with lead, where lead exits plastic body at bottom of parting line. 3. datums a-b and -d- to be determined at centerline between leads where leads exit plastic body at datum plane -h-. 4. to be determined at seating plane -c-. 5. dimensions d1 and e1 do not include mold protrusion. 6. ??is the total # of terminals. 7. these dimensions to be determined at the datum plane -h-. 8. package top dimensions are smaller than bottom dimensions and top of package will not overhang bottom of package. 9. dimension b does not include dambar protrusion. allowable dambar protrusion shall be 0.08 mm total in excess of the b dimension at maximum material condition. dambar cannot be located on the lower radius or the foot. 10. controlling dimension: millimeter. 11. maximum allowable die thickness to be assembled in this package family is 0.30 millimeters. 12. this outline conforms to jedec publication 95, registration mo-136, variations ac, ae, and af.
9 revision 2 / october 21, 2002 www .semtech.com test and measurement products edge646 recommended operating conditions absolute maximum ratings r e t e m a r a pl o b m y sn i mp y tx a ms t i n u y l p p u s r e w o p g o l a n a e v i t i s o pc c v682 1v y l p p u s r e w o p g o l a n a e v i t a g e ne e v5 -4 -3 -v y l p p u s r e w o p g o l a n a l a t o te e v - c c v9 2 1v l e v e l h g i h t u p t u o r o t a r a p m o cl e v e l h g i h2 -5 +v l e v e l w o l t u p t u o r o t a r a p m o cl e v e l w o l2 -5 +v e r u t a r e p m e t n o i t c n u jj t5 2 1 + o c r e t e m a r a pl o b m y sn i mp y tx a ms t i n u y l p p u s r e w o p g o l a n a l a t o te e v - c c v0 3 1v y l p p u s r e w o p g o l a n a e v i t i s o pc c v0 3 1v y l p p u s r e w o p g o l a n a e v i t a g e ne e v6 -0v s e g a t l o v t u p n i g o l a n a5 . - e e v5 . + c c vv s t u p n i l a t i g i d5 . - e e v5 . + c c vv e r u t a r e p m e t g n i t a r e p o t n e i b m aa t5 5 -5 2 1 + o c e r u t a r e p m e t e g a r o t s5 6 -0 5 1 + o c e r u t a r e p m e t n o i t c n u jj t0 5 1 + o c e r u t a r e p m e t g n i r e d l o s 0 6 2 o c stresses above listed under absolute maximum ratings?may cause permanent damage to the device. this is a stress rating only and functional operation of the device at these or any other conditions above those listed in the operational sections of this specification is not implied. exposure to absolute maximum rating conditions for extended periods may affect device reliability.
10 revision 2 / october 21, 2002 www .semtech.com test and measurement products edge646 dc characteristics r e t e m a r a pl o b m y sn i mp y tx a ms t i n u r e v i r d s e g a t l o v t u p t u o r e v i r d e l b a m m a r g o r p g n i w s t u p t u o r e v i r d t t v , l v , h v l v - h v t t v - h v l l v - t t v e e v c c v - e e v c c v - e e v c c v - e e v c c v e e v - c c v e e v - c c v e e v - c c v v v v v t n e r r u c t u p t u o r e v i r d c dc d t u o i0 5 -0 5 +a m ) 1 e t o n ( t n e r r u c t u p t u o r e v i r d c ac a t u o i0 2 2 -0 2 2 +a m e c n a d e p m i t u p t u ot u o r0 25 22 3 ? ) 1 e t o n ( e c n a t i c a p a c n i p t u dt u o c3 1f p ) 2 , 1 s e t o n ( t n e r r u c e g a k a e l z i hk a e l i04a n r o t a r a p m o c e g a t l o v t u p n ip n i ve e vc c vv ) 2 , 1 s e t o n ( t n e r r u c e g a k a e l t u p n is a i b i02a n ) 1 e t o n ( e c n a t i c a p a c t u p n in i c4f p ) 3 e t o n ( e g a t l o v t e s f f os o v0 0 0 2 +v m ) 3 e t o n ( d l o h s e r h t r e v i e c e r 0 . 3 + e e v0 . 2 - c c vv ) 1 e t o n ( t n e r r u c s a i b d l o h s e r h tb v c , a v c00 1a n l e v e l h g i h t u p t u o l a t i g i dl e v e l h g i h2 -5v l e v e l w o l u t p t u o l a t i g i dl e v e l w o l2 -5v ) 4 e t o n ( e c n a d e p m i t u p t u o l a t i g i dt u o r1 37 35 4 ? e v i r d t n e r r u c t u p t u o l a t i g i dx a m i0 5 -0 5 +a m ) 2 w s , 1 w s , 0 w s ( s e h c t i w s g o l a n a e c n a t s i s e r n on o r0 36 34 4 ? e g n a r e g a t l o ve e vc c vv ) 2 , 1 s e t o n ( t n e r r u c e g a k a e l z i h d a o l 04a n g n i t a r t n e r r u c c d0 3 -0 3 +a m e c n a t i c a p a c w s 0 1f p y l p p u s r e w o p l a t o t t n e r r u c y l p p u s e v i t i s o p t n e c s e i u q t n e r r u c y l p p u s e v i t a g e n t n e c s e i u q c d _ c c i c d _ e e i 0 3 0 3 a m a m ) 1 e t o n ( e g a k a e l l a t o t ) d a o l + p n i v + t u o d ( 00 1a n ) 1 e t o n ( e c n a t i c a p a c l a t o t ) d a o l + p n i v + t u o d ( 7 2f p driver/receiver characteristics
11 revision 2 / october 21, 2002 www .semtech.com test and measurement products edge646 dc characteristics (continued) r e t e m a r a pl o b m y sn i mp y tx a ms t i n u e g a t l o v h g i h t u p n i* t u p n i - t u p n i8 .5v e g a t l o v w o l t u p n it u p n i - * t u p n i8 .5v t n e r r u c t u p n in i i00 . 1a e c n a t i c a p a c t u p n ia t a d n e v r d n e t t v 8 8 8 f p f p f p e g n a r e g a t l o v t u p n i l a t i g i d* t u p n i , t u p n i* 0 . 2 -0 . 5 +v d l o h s e r h t t u p n i l a t i g i db b v4 . 1 -4 . 4v note 1 : this parameter is guaranteed by design and characterization. note 2 : production testing is performed against a 250 na limit. note 3 : measured at 0v. note 4 : measured at high level = +3v, low level = 0v. *-2v or (vee + 2.0v), whichever is more positive. digital inputs data / data*, dvr en* / dvr en, vtt en / vtt en* sw0 en*, sw1 en*, sw2 en*
12 revision 2 / october 21, 2002 www .semtech.com test and measurement products edge646 ac characteristics r e t e m a r a pl o b m y sn i mp y tx a ms t i n u r e v i r d ) 3 e t o n ( y a l e d n o i t a g a p o r p t u o d o t n i a t a d t u o d o t n e t t v ) 5 e t o n ( ) z i h o t e v i t c a ( t u o d o t * n e r v d ) 5 e t o n ( ) e v i t c a o t z i h ( t u o d o t * n e r v d ) 4 e t o n ( g n i h c t a m y a l e d p o r p t t v o t a t a d 7 7 7 7 2 . 1 - 1 1 1 1 1 1 1 1 4 1 4 1 4 1 4 1 2 . 1 s n s n s n s n s n ) g n i w s v 3 ( h t d i w e s l u p m u m i n i m 45s n ) 6 e t o n ( e t a r e l g g o tx a m f0 0 1z h m ) 4 , 1 s e t o n ( s e m i t l l a f / e s i r t u p t u o t u o d ) % 0 8 - % 0 2 ( g n i w s v 1 ) % 0 9 - % 0 1 ( g n i w s v 3 ) 5 0 9 - % 0 1 ( g n i w s v 5 0 . 1 2 . 1 5 . 1 0 . 2 6 . 1 0 . 2 5 . 3 s n s n s n r o t a r a p m o c ) 4 , 2 s e t o n ( s t u p t u o l a t i g i d r o t a r a p m o c ) % 0 9 - % 0 1 ( e m i t e s i r ) % 0 9 - % 0 1 ( e m i t l l a f b p m o c , a p m o c o t p n i v r t f t d p t4 5 . 1 5 . 1 8 5 . 2 5 . 2 1 1 s n s n s n h t d i w e s l u p m u m i n i m 45s n ) 6 e t o n ( e t a r e l g g o tx a m f0 0 1z h m ? e v i r d r e v o . s v d p t e v i r d r e v o v m 0 0 4 e v i r d r e v o v m 0 0 2 0 . 3 0 . 5 s n s n s r o r r e l l a f d p t , e s i r d p t 0 . 2s n x i r t a m h c t i w s f f o / n o h c t i w s o t * n e 2 , 1 , 0 w s0 10 20 5s n note 1 : into 1m of 50 ? transmission line terminated with 1k ? and 5 pf with the proper series termination resistor. note 2 : low level = 0v, high level = 3.3v. note 3 : measured at 2.5v with vh = +5v, vl = 0v. note 4 : guaranteed by design and characterization. this parameter is not tested in production. note 5 : tested with a 30 ma load. note 6 : guaranteed by characterization. (this parameter is tested in production against 40 mhz limits.)
13 revision 2 / october 21, 2002 www .semtech.com test and measurement products edge646 ordering information contact information semtech corporation test and measurement division 10021 willow creek rd., san diego, ca 92131 phone: (858)695-1801 fax (858)695-2633 r e b m u n l e d o me g a k c a p f t a 6 4 6 ep f q t n i p - 2 3 f t a 6 4 6 m v en o i t a u l a v e 6 4 6 e g d e e l u d o m
14 revision 2 / october 21, 2002 www .semtech.com test and measurement products edge646 revision history current revision date: october 21, 2002 previous revision date: october 27, 2000 # e g a pe m a n n o i t c e sn o i s i v e r s u o i v e r pn o i s i v e r t n e r r u c 6n o i t c e t o r p p u h c t a l " s e i l p p u s r e w o p " o t e m a n n o i t c e s e g n a h c . n o i t c e s e t a d p u revision history


▲Up To Search▲   

 
Price & Availability of EVM646ATF

All Rights Reserved © IC-ON-LINE 2003 - 2022  

[Add Bookmark] [Contact Us] [Link exchange] [Privacy policy]
Mirror Sites :  [www.datasheet.hk]   [www.maxim4u.com]  [www.ic-on-line.cn] [www.ic-on-line.com] [www.ic-on-line.net] [www.alldatasheet.com.cn] [www.gdcy.com]  [www.gdcy.net]


 . . . . .
  We use cookies to deliver the best possible web experience and assist with our advertising efforts. By continuing to use this site, you consent to the use of cookies. For more information on cookies, please take a look at our Privacy Policy. X